검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
ECT Image Analysis Methods for Shear Zone Measurements during Silo Discharging Process Grudzien K, Chaniecki Z, Romanowski A, Niedostatkiewicz M, Sankowski D Chinese Journal of Chemical Engineering, 20(2), 337, 2012 |
| 2 |
Measurement of Dynamic Liquid Distributions in a Fixed Bed Using Electrical Capacitance Tomography and Capacitance Wire-Mesh Sensor Matusiak B, da Silva MJ, Hampel U, Romanowski A Industrial & Engineering Chemistry Research, 49(5), 2070, 2010 |
| 3 |
Gravitational granular flow dynamics study based on tomographic data processing Grudzien K, Romanowski A, Sankowski D, Williams RA Particulate Science and Technology, 26(1), 67, 2008 |
| 4 |
Application of a Bayesian approach to the tomographic analysis of hopper flow Grudzien K, Romanowski A, Williams RA Particle & Particle Systems Characterization, 22(4), 246, 2006 |
| 5 |
Advanced statistical analysis as a novel tool to pneumatic conveying monitoring and control strategy development Romanowski A, Grudzien K, Aykroyd RG, Williams RA Particle & Particle Systems Characterization, 23(3-4), 289, 2006 |
| 6 |
Analysis and interpretation of hopper flow behaviour using electrical capacitance tomography Romanowski A, Grudzien K, Williams RA Particle & Particle Systems Characterization, 23(3-4), 297, 2006 |
| 7 |
Bias dependent contrast mechanisms in EBIC images of MOS capacitors Kirk HR, Radzimski Z, Romanowski A, Rozgonyi GA Journal of the Electrochemical Society, 146(4), 1529, 1999 |
| 8 |
Oxide precipitate-induced dislocation generation in heavily boron-doped Czochralski silicon Ono T, Romanowski A, Asayama E, Horie H, Sueoka K, Tsuya H, Rozgonyi GA Journal of the Electrochemical Society, 146(9), 3461, 1999 |
| 9 |
Metallic Impurity Gettering and Secondary Defect Formation in Megaelectron Volt Self-Implanted Czochralski and Float-Zone Silicon Brown RA, Kononchuk O, Bondarenko I, Romanowski A, Radzimski Z, Rozgonyi GA, Gonzalez F Journal of the Electrochemical Society, 144(8), 2872, 1997 |