검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Protrusion Formation at the Edges of Ion-Implanted Regions Rotondaro AL, Bender H, Heyns MM, Claeys C Journal of the Electrochemical Society, 143(6), L118, 1996 |
| 2 |
Impact of Fe and Cu Contamination on the Minority-Carrier Lifetime of Silicon Substrates Rotondaro AL, Hurd TQ, Kaniava A, Vanhellemont J, Simoen E, Heyns MM, Claeys C Journal of the Electrochemical Society, 143(9), 3014, 1996 |
| 3 |
Sensitive Light-Scattering as a Semiquantitative Method for Studying Photoresist Stripping Rotondaro AL, Meuris M, Schmidt HF, Heyns MM, Claeys C, Hellemans L, Snauwaert J Journal of the Electrochemical Society, 142(1), 211, 1995 |