화학공학소재연구정보센터
검색결과 : 17건
No. Article
1 Removal of Tin from Extreme Ultraviolet Collector Optics by In-Situ Hydrogen Plasma Etching
Elg DT, Panici GA, Liu SM, Girolami G, Srivastava SN, Ruzic DN
Plasma Chemistry and Plasma Processing, 38(1), 223, 2018
2 Removal of Tin from Extreme Ultraviolet Collector Optics by In-Situ Hydrogen Plasma Etching (vol 38, pg 223, 2018)
Elg DT, Panici GA, Liu SM, Girolami G, Srivastava SN, Ruzic DN
Plasma Chemistry and Plasma Processing, 38(4), 917, 2018
3 Recent developments in surface science and engineering, thin films, nanoscience, biomaterials, plasma science, and vacuum technology
Mozetic M, Vesel A, Primc G, Eisenmenger-Sittner C, Bauer J, Eder A, Schmid GHS, Ruzic DN, Ahmed Z, Barker D, Douglass KO, Eckel S, Fedchak JA, Hendricks J, Klimov N, Ricker J, Scherschligt J, Stone J, Strouse G, Capan I, Buljan M, Milosevic S, Teichert C, Cohen SR, Silva AG, Lehocky M, Humpolicek P, Rodriguez C, Hernandez-Montelongo J, Mercier D, Manso-Silvan M, Ceccone G, Galtayries A, Stana-Kleinschek K, Petrov I, Greene JE, Avila J, Chen CY, Caja-Munoz B, Yi H, Boury A, Lorcy S, Asensio MC, Bredin J, Gans T, O'Connell D, Brendin J, Reniers F, Vincze A, Anderle M, Montelius L
Thin Solid Films, 660, 120, 2018
4 In situ plasma diagnostics study of a commercial high-power hollow cathode magnetron deposition tool
Meng L, Raju R, Flauta R, Shin H, Ruzic DN, Hayden DB
Journal of Vacuum Science & Technology A, 28(1), 112, 2010
5 Lithium research as a plasma facing component material at the University of Illinois
Surla V, Jaworski MA, Gray TK, Ibano K, Xu W, Neumann MJ, Ruzic DN
Thin Solid Films, 518(22), 6663, 2010
6 Tin removal from extreme ultraviolet collector optics by inductively coupled plasma reactive ion etching
Shin H, Srivastava SN, Ruzic DN
Journal of Vacuum Science & Technology A, 26(3), 389, 2008
7 Integrated model for chemically enhanced physical vapor deposition of tantalum nitride-based films
Li N, Brenner PW, Ruzic DN
Journal of Vacuum Science & Technology B, 24(3), 1162, 2006
8 Chemically enhanced physical vapor deposition of tantalum nitride-based films for ultra-large-scale integrated devices
Li N, Ruzic DN, Powell RA
Journal of Vacuum Science & Technology B, 22(6), 2734, 2004
9 Absolute sputtering yield of Ti/TiN by Ar+/N+ at 400-700 eV
Ranjan R, Allain JP, Hendricks MR, Ruzic DN
Journal of Vacuum Science & Technology A, 19(3), 1004, 2001
10 Characterization of magnetron-sputtered partially ionized deposition as a function of metal and gas species
Allain MMC, Hayden DB, Juliano DR, Ruzic DN
Journal of Vacuum Science & Technology A, 18(3), 797, 2000