검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Microstructural change of dislocation structure around SiGe/Si interface in SGOI wafer with ramping process Ii S, Takaki Y, Ikeda K, Nakashima H, Nakashima H Thin Solid Films, 517(1), 38, 2008 |
| No. | Article |
|---|---|
| 1 |
Microstructural change of dislocation structure around SiGe/Si interface in SGOI wafer with ramping process Ii S, Takaki Y, Ikeda K, Nakashima H, Nakashima H Thin Solid Films, 517(1), 38, 2008 |