검색결과 : 2건
No. | Article |
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1 |
Interface structure between silicon and its oxide by first-principles molecular dynamics Pasquarello A, Hybertsen MS, Car R Nature, 396(6706), 58, 1998 |
2 |
The Evolution of (001)Si/SiO2 Interface Roughness During Thermal-Oxidation Fang SJ, Chen W, Yamanaka T, Helms CR Journal of the Electrochemical Society, 144(8), 2886, 1997 |