검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Determination of Chemistry and Microstructure in SiOx (0.1-Less-Than-X-Less-Than-0.8) Films by X-Ray Photoelectron-Spectroscopy Shallenberger JR Journal of Vacuum Science & Technology A, 14(3), 693, 1996 |
| No. | Article |
|---|---|
| 1 |
Determination of Chemistry and Microstructure in SiOx (0.1-Less-Than-X-Less-Than-0.8) Films by X-Ray Photoelectron-Spectroscopy Shallenberger JR Journal of Vacuum Science & Technology A, 14(3), 693, 1996 |