검색결과 : 1건
No. | Article |
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1 |
Magnification correction by changing wafer temperature in proximity x-ray lithography Aoyama H, Mitsui S, Taguchi T, Tanaka Y, Matsui Y, Fukuda M, Suzuki M, Haga T, Morita H Journal of Vacuum Science & Technology B, 17(6), 3411, 1999 |