검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Modelling of B diffusion in the presence of Ga Radic L, Saavedra AF, Jones KS, Law ME Journal of Vacuum Science & Technology B, 24(1), 478, 2006 |
| 2 |
Comparison of {311} defect evolution in SIMOX and bonded SOI materials Saavedra AF, Jones KS, Law ME, Chan KK Journal of the Electrochemical Society, 151(4), G266, 2004 |
| 3 |
Secondary defect formation in bonded silicon-on-insulator after boron implantation Saavedra AF, King AC, Jones KS, Jones EC, Chan KK Journal of Vacuum Science & Technology B, 22(1), 459, 2004 |
| 4 |
Influence of the surface Si/buried oxide interface on extended defect evolution in silicon-on-insulator scaled to 300 angstrom Saavedra AF, Frazer J, Jones KS, Avci I, Earles SK, Law ME, Jones EC Journal of Vacuum Science & Technology B, 20(6), 2243, 2002 |