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| No. | Article |
|---|---|
| 1 |
Real time spectroscopic ellipsometry of Ag/ZnO and Al/ZnO interfaces for back-reflectors in thin film Si:H photovoltaics Dahal LR, Sainju D, Podraza NJ, Marsillac S, Collins RW Thin Solid Films, 519(9), 2682, 2011 |
| No. | Article |
|---|---|
| 1 |
Real time spectroscopic ellipsometry of Ag/ZnO and Al/ZnO interfaces for back-reflectors in thin film Si:H photovoltaics Dahal LR, Sainju D, Podraza NJ, Marsillac S, Collins RW Thin Solid Films, 519(9), 2682, 2011 |