검색결과 : 1건
No. | Article |
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1 |
A new, general model for mechanical stress evolution during electromigration Sarychev ME, Zhitnikov YV, Borucki L, Liu CL, Makhviladze TM Thin Solid Films, 365(2), 211, 2000 |
No. | Article |
---|---|
1 |
A new, general model for mechanical stress evolution during electromigration Sarychev ME, Zhitnikov YV, Borucki L, Liu CL, Makhviladze TM Thin Solid Films, 365(2), 211, 2000 |