화학공학소재연구정보센터
검색결과 : 17건
No. Article
1 Evidence of low-symmetry phases in pressure-dependent Raman spectroscopic study of BaTiO3
Tyagi S, Sathe VG, Sharma G, Srihari V, Poswal HK
Journal of Materials Science, 53(10), 7224, 2018
2 Detail investigations of SmFeO3 under extreme condition
Tyagi S, Sathe VG, Sharma G, Gupta MK, Mittal R, Srihari V, Poswal HK
Materials Chemistry and Physics, 215, 393, 2018
3 Study of spin-phonon coupling and magnetic field induced spin reorientation in polycrystalline multiferroic GdFeO3
Panchwanee A, Reddy VR, Gupta A, Sathe VG
Materials Chemistry and Physics, 196, 205, 2017
4 Effect of surface morphology on the optical properties of InAs/Ge (111)
Pal S, Sathe VG, Rajiv K, Mukherjee C, Kumar R, Dixit VK
Applied Surface Science, 372, 70, 2016
5 Surface studies on benzophenone doped PDMS microstructures fabricated using KrF excimer laser direct write lithography
Kant MB, Shinde SD, Bodas D, Patil KR, Sathe VG, Adhi KP, Gosavi SW
Applied Surface Science, 314, 292, 2014
6 Spray pyrolysis deposition of p-CdTe films: Structural, optical and electrical properties
Gunjal SD, Khollam YB, Jadkar SR, Shripathi T, Sathe VG, Shelke PN, Takwale MG, Mohite KC
Solar Energy, 106, 56, 2014
7 Stabilization of robust antiferromagnetic insulating phase in Nd1-xSrxMnO3 (x=0.46) by application of biaxial strain
Kumar D, Kumar S, Rawat R, Choudhary RJ, Sathe VG
Thin Solid Films, 566, 5, 2014
8 Thermal stability studies of ion beam sputter deposited C/B4C X-ray multilayer mirror
Rao PN, Modi MH, Rai SK, Sathe VG, Deb SK, Lodha GS
Thin Solid Films, 527, 244, 2013
9 Influence of helium dilution of silane on microstructure and opto-electrical properties of hydrogenated nanocrystalline silicon (nc-Si:H) thin films deposited by HW-CVD
Waman VS, Kamble MM, Ghosh SS, Hawaldar RR, Amalnerkar DP, Sathe VG, Gosavi SW, Jadkar SR
Materials Research Bulletin, 47(11), 3445, 2012
10 Blue shift of optical band-gap in LiNbO3 thin films deposited by sol-gel technique
Satapathy S, Mukherjee C, Shaktawat T, Gupta PK, Sathe VG
Thin Solid Films, 520(21), 6510, 2012