화학공학소재연구정보센터
검색결과 : 16건
No. Article
1 Transparent hybrid inorganic/organic barrier coatings for plastic organic light-emitting diode substrates
Kim TW, Yan M, Erlat G, McConnelee PA, Pellow M, Deluca J, Feist TP, Duggal AR, Schaepkens M
Journal of Vacuum Science & Technology A, 23(4), 971, 2005
2 Ultrahigh barrier coating deposition on polycarbonate substrates
Schaepkens M, Kim TW, Erlat AG, Yan M, Flanagan KW, Heller CM, McConnelee PA
Journal of Vacuum Science & Technology A, 22(4), 1716, 2004
3 High-rate deposition of abrasion resistant coatings using a dual-source expanding thermal plasma reactor
Schaepkens M, Selezneva S, Moeleker P, Iacovangelo CD
Journal of Vacuum Science & Technology A, 21(4), 1266, 2003
4 Spatially resolved mass spectrometric sampling of inductively coupled plasmas using a movable sampling orifice
Li X, Oehrlein GS, Schaepkens M, Ellefson RE, Frees LC
Journal of Vacuum Science & Technology A, 21(6), 1971, 2003
5 Stripping of photoresist using a remote thermal Ar/O-2 and Ar/N-2/O-2 plasma
Brussaard GJH, Letourneur KGY, Schaepkens M, van de Sanden MCM, Schram DC
Journal of Vacuum Science & Technology B, 21(1), 61, 2003
6 A review of SiO2 etching studies in inductively coupled fluorocarbon plasmas
Schaepkens M, Oehrlein GS
Journal of the Electrochemical Society, 148(3), C211, 2001
7 Gas-phase studies in inductively coupled fluorocarbon plasmas
Schaepkens M, Martini I, Sanjuan EA, Li X, Oehrlein GS, Perry WL, Anderson HM
Journal of Vacuum Science & Technology A, 19(6), 2946, 2001
8 Effect of radio frequency bias power on SiO2 feature etching in inductively coupled fluorocarbon plasmas
Schaepkens M, Oehrlein GS, Cook JM
Journal of Vacuum Science & Technology B, 18(2), 848, 2000
9 Study of the SiO2-to-Si3N4 etch selectivity mechanism in inductively coupled fluorocarbon plasmas and a comparison with the SiO2-to-Si mechanism
Schaepkens M, Standaert TEFM, Rueger NR, Sebel PGM, Oehrlein GS, Cook JM
Journal of Vacuum Science & Technology A, 17(1), 26, 1999
10 Mass spectrometric measurements on inductively coupled fluorocarbon plasmas: Positive ions, radicals and endpoint detection
Li X, Schaepkens M, Oehrlein GS, Ellefson RE, Frees LC, Mueller N, Korner N
Journal of Vacuum Science & Technology A, 17(5), 2438, 1999