검색결과 : 22건
| No. | Article |
|---|---|
| 1 |
Formation of block-copolymer-templated mesoporous silica Bjork EM, Makie P, Rogstrom L, Atakan A, Schell N, Oder M Journal of Colloid and Interface Science, 521, 183, 2018 |
| 2 |
Formation of a quasicrystalline phase in Al-Mn base alloys cast at intermediate cooling rates Stan-Glowinska K, Rogal L, Goral A, Wierzbicka-Miernik A, Wojewoda-Budka J, Schell N, Litynska-Dobrzynska L Journal of Materials Science, 52(13), 7794, 2017 |
| 3 |
Phase transformation kinetics during continuous heating of a beta-quenched Ti-10V-2Fe-3Al alloy Barriobero-Vila P, Requena G, Warchomicka F, Stark A, Schell N, Buslaps T Journal of Materials Science, 50(3), 1412, 2015 |
| 4 |
Thermal stability of epitaxial cubic-TiN/(Al,Sc)N metal/semiconductor superlattices Schroeder JL, Saha B, Garbrecht M, Schell N, Sands TD, Birch J Journal of Materials Science, 50(8), 3200, 2015 |
| 5 |
Influence of rare-earth addition on the long-period stacking ordered phase in cast Mg-Y-Zn alloys Garces G, Requena G, Tolnai D, Perez P, Adeva P, Stark A, Schell N Journal of Materials Science, 49(7), 2714, 2014 |
| 6 |
Texture development, microstructure and phase transformation characteristics of sputtered Ni-Ti Shape Memory Alloy films grown on TiN < 111 > Martins RMS, Schell N, Reuther H, Pereira L, Mahesh KK, Silva RJC, Fernandes FMB Thin Solid Films, 519(1), 122, 2010 |
| 7 |
Corrigendum to "Nickel assisted metal induced crystallization of silicon: Effect of native silicon oxide layer" Pereira L, Martins RMS, Schell N, Fortunato E, Martins R Thin Solid Films, 516(1), 104, 2007 |
| 8 |
In-situ observation of Ni-Ti thin film growth by synchrotron radiation scattering Martins RMS, Fernandes FMB, Silva RJC, Beckers M, Schell N Materials Science Forum, 514-516, 1588, 2006 |
| 9 |
Nickel-assisted metal-induced crystallization of silicon: Effect of native silicon oxide layer Pereira L, Martins RMS, Schell N, Fortunato E, Martins R Thin Solid Films, 511, 275, 2006 |
| 10 |
In situ x-ray diffraction studies concerning the influence of Al concentration on the texture development during sputter deposition of Ti-Al-N thin films Beckers M, Schell N, Martins RMS, Mucklich A, Moller W Journal of Vacuum Science & Technology A, 23(5), 1384, 2005 |