검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
Low-power DRAM-compatible Replacement Gate High-k/Metal Gate Stacks Ritzenthaler R, Schram T, Bury E, Spessot A, Caillat C, Srividya V, Sebaai F, Mitard J, Ragnarsson LA, Groeseneken G, Horiguchi N, Fazan P, Thean A Solid-State Electronics, 84, 22, 2013 |
| 2 |
Development of ALD HfZrOx with TDEAH/TDEAZ and H2O Shi X, Tielens H, Takeoka S, Nakabayashi T, Nyns L, Adelmann C, Delabie A, Schram T, Ragnarsson L, Schaekers M, Date L, Schreutelkamp R, Van Elshocht S Journal of the Electrochemical Society, 158(1), H69, 2011 |
| 3 |
Numerical simulation of air flow through turbocharger compressors with dual volute design Jiao K, Sun H, Li XG, Wu H, Krivitzky E, Schram T, Larosiliere LM Applied Energy, 86(11), 2494, 2009 |
| 4 |
Alternative high-k dielectrics for semiconductor applications Van Elshocht S, Adelmann C, Clima S, Pourtois G, Conard T, Delabie A, Franquet A, Lehnen P, Meersschaut J, Menou N, Popovici M, Richard O, Schram T, Wang XP, Hardy A, Dewulf D, Van Bael MK, Lehnen P, Blomberg T, Pierreux D, Swerts J, Maes JW, Wouters DJ, De Gendt S, Kittl JA Journal of Vacuum Science & Technology B, 27(1), 209, 2009 |
| 5 |
Investigation on molybdenum and its conductive oxides as p-type metal gate candidates Li Z, Schram T, Witters T, Cho HJ, O'Sullivan B, Yamada N, Takaaki T, Hooker J, De Gendt S, De Meyer K Journal of the Electrochemical Society, 155(7), H481, 2008 |
| 6 |
Evaluation of atomic layer deposited NbN and NbSiN as metal gate materials Van Hoornick N, De Witte H, Witters T, Zhao C, Conard T, Huotari H, Swerts J, Schram T, Maes JW, De Gendt S, Heyns M Journal of the Electrochemical Society, 153(5), G437, 2006 |
| 7 |
Study of the formation of chromate conversion coatings on Alclad 2024 aluminum alloy using spectroscopic ellipsometry Campestrini P, Bohm S, Schram T, Terryn H, de Wit JHW Thin Solid Films, 410(1-2), 76, 2002 |
| 8 |
The use of infrared spectroscopic ellipsometry for the thickness determination and molecular characterization of thin films on aluminum Schram T, Terryn H Journal of the Electrochemical Society, 148(2), F12, 2001 |
| 9 |
Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry Franquet A, De Laet J, Schram T, Terryn H, Subramanian V, van Ooij WJ, Vereecken J Thin Solid Films, 384(1), 37, 2001 |
| 10 |
Nondestructive optical characterization of chemical conversion coatings on aluminum Schram T, De Laet J, Terryn H Journal of the Electrochemical Society, 145(8), 2733, 1998 |