검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Nondestructive Thickness Determination of Thin Cobalt and Cobalt Disilicide Layers on Silicon Substrates Roca E, Vanhellemont J, Schreutelkamp RJ, Vermeiren J Thin Solid Films, 240(1-2), 110, 1994 |
| 2 |
Nondestructive Characterization of the Uniformity of Thin Cobalt Disilicide Films by Raman Microprobe Measurements Perezrodriguez A, Roca E, Jawhari T, Morante JR, Schreutelkamp RJ Thin Solid Films, 251(1), 45, 1994 |