검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Charge pumping and DCIV currents in SOI FinFETs Zhang EX, Fleetwood DM, Francis SA, Zhang CX, El-Mamouni F, Schrimpf RD Solid-State Electronics, 78, 75, 2012 |
| 2 |
Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling Pantelides ST, Tsetseris L, Beck MJ, Rashkeev SN, Hadjisavvas G, Batyrev IG, Tuttle BR, Marinopoulos AG, Zhou XJ, Fleetwood DM, Schrimpf RD Solid-State Electronics, 54(9), 841, 2010 |
| 3 |
Effects of fin width on memory windows in FinFET ZRAMs Zhang EX, Fleetwood DM, Alles ML, Schrimpf RD, Mamouni FE, Xiong W, Cristoloveanu S Solid-State Electronics, 54(10), 1155, 2010 |
| 4 |
A model of radiation effects in nitride-oxide films for power MOSFET applications Raparla VAK, Lee SC, Schrimpf RD, Fleetwood DM, Galloway KF Solid-State Electronics, 47(5), 775, 2003 |