검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Enhancement of carbon nanotube FET performance via direct synthesis of poly (sodium 4-styrenesulfonate) in the transistor channel Toader M, Schubel R, Hartmann M, Scharfenberg L, Jordan R, Mertig M, Schulz SE, Gessner T, Hermann S Chemical Physics Letters, 661, 1, 2016 |
| 2 |
Experimental and computational studies on the role of surface functional groups in the mechanical behavior of interfaces between single-walled carbon nanotubes and metals Hartmann S, Sturm H, Blaudeck T, Holck O, Hermann S, Schulz SE, Gessner T, Wunderle B Journal of Materials Science, 51(3), 1217, 2016 |
| 3 |
Manganese half-sandwich complexes as metal-organic chemical vapor deposition precursors for manganese-based thin films Assim K, Jeschke J, Jakob A, Dhakal D, Melzer M, Georgi C, Schulz SE, Gessner T, Lang H Thin Solid Films, 619, 265, 2016 |
| 4 |
Magneto-optical Kerr-effect studies on copper oxide thin films produced by atomic layer deposition on SiO2 Fronk M, Muller S, Waechtler T, Schulz SE, Mothes R, Lang H, Zahn DRT, Salvan G Thin Solid Films, 520(14), 4741, 2012 |
| 5 |
The Inhibition of Enhanced Cu Oxidation on Ruthenium/Diffusion Barrier Layers for Cu Interconnects by Carbon Alloying into Ru Ding SF, Xie Q, Mueller S, Waechtler T, Lu HS, Schulz SE, Detavernier C, Qu XP, Gessner T Journal of the Electrochemical Society, 158(12), H1228, 2011 |
| 6 |
Chemical Repair of Plasma Damaged Porous Ultra Low-kappa SiOCH Film Using a Vapor Phase Process Oszinda T, Schaller M, Schulz SE Journal of the Electrochemical Society, 157(12), II1140, 2010 |
| 7 |
Copper Oxide Films Grown by Atomic Layer Deposition from Bis(tri-n-butylphosphane)copper(I)acetylacetonate on Ta, TaN, Ru, and SiO2 Waechtler T, Oswald S, Roth N, Jakob A, Lang H, Ecke R, Schulz SE, Gessner T, Moskvinova A, Schulze S, Hietschold M Journal of the Electrochemical Society, 156(6), H453, 2009 |
| 8 |
Improved characterization of Fourier transform infrared spectra analysis for post-etched ultra-low-kappa SiOCH dielectric using chemometric methods Oszinda T, Beyer V, Schaller M, Fischer D, Bartsch C, Schulz SE Journal of Vacuum Science & Technology B, 27(1), 521, 2009 |
| 9 |
Contributions to the static dielectric constant of low-k xerogel films derived from ellipsometry and IR spectroscopy Himcinschi C, Friedrich M, Fruhauf S, Schulz SE, Gessner T, Zahn DRT Thin Solid Films, 455-56, 433, 2004 |
| 10 |
Characterization of thin-film aerogel porosity and stiffness with laser-generated surface acoustic waves Flannery CM, Murray C, Streiter I, Schulz SE Thin Solid Films, 388(1-2), 1, 2001 |