| 1 |
Monte Carlo raytracing method for calculating secondary electron emission from micro-architected surfaces
Alvarado A, Chang HY, Nadvornick W, Ghoniem N, Marian J
Applied Surface Science, 478, 142, 2019 |
| 2 |
An improved corona discharge ignited by oxide cathodes with high secondary electron emission for toluene degradation
Yao XM, Jiang N, Li J, Lu N, Shang KF, Wu Y
Chemical Engineering Journal, 362, 339, 2019 |
| 3 |
Calculation of secondary electron emission yields from low-energy electron deposition in tungsten surfaces
Chang HY, Alvarado A, Marian J
Applied Surface Science, 450, 190, 2018 |
| 4 |
Influence of the substrate temperature on the microstructure and electron induced secondary electron emission properties of MgO/Au composite film
Li J, Hue WB, Hao L, Wu SL, Zhang JT
Materials Research Bulletin, 100, 308, 2018 |
| 5 |
Physico-Chemical Processes Induced by Electrical Breakdown and Discharge Responsible for Memory Effect in Krypton with < 10 ppm Nitrogen
Pejovic MM, Pejovic MM, Stankovic K
Plasma Chemistry and Plasma Processing, 38(2), 415, 2018 |
| 6 |
Secondary electron emission properties of Zn-doped MgO thin films grown via electron-beam evaporation
Yu HK
Thin Solid Films, 653, 57, 2018 |
| 7 |
Role of the tail of high-energy secondary electrons in the Monte Carlo evaluation of the fraction of electrons backscattered from polymethylmethacrylate
Dapor M
Applied Surface Science, 391, 3, 2017 |
| 8 |
Reduction of secondary electron yield for E-cloud mitigation by laser ablation surface engineering
Valizadeh R, Malyshev OB, Wang S, Sian T, Cropper MD, Sykes N
Applied Surface Science, 404, 370, 2017 |
| 9 |
Discharge and structural characteristics of MgO thin films under various O-2 and H-2 gas flow rates during MgO deposition when using ion plating method in microdischarge cells
Kim DH, Park CS, Jung EY, Kim HJ, Seo H, Hong JG, Shin BJ, Tae HS
Molecular Crystals and Liquid Crystals, 645(1), 123, 2017 |
| 10 |
Investigation of argon ion sputtering on the secondary electron emission from gold samples
Yang J, Cui WZ, Li Y, Xie GB, Zhang N, Wang R, Hu TC, Zhang HT
Applied Surface Science, 382, 88, 2016 |
