검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry Drozdov MN, Drozdov YN, Csik A, Novikov AV, Vad K, Yunin PA, Yurasov DV, Belykh SF, Gololobov GP, Suvorov DV, Tolstogouzov A Thin Solid Films, 607, 25, 2016 |
| 2 |
On the composition depth profile of electrodeposited Fe-Co-Ni alloys Peter L, Csik A, Vad K, Toth-Kadar E, Pekker A, Molnar G Electrochimica Acta, 55(16), 4734, 2010 |
| 3 |
Electrodeposition of Ni-Co-Cu/Cu multilayers - 2. Calculations of the element distribution and experimental depth profile analysis Peter L, Katona GL, Bernyi Z, Vad K, Langer GA, Toth-Kadar E, Padar J, Pogany L, Bakonyi I Electrochimica Acta, 53(2), 837, 2007 |
| 4 |
A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin films Kothleitner G, Rogers M, Berendes A, Bock W, Kolbesen BO Applied Surface Science, 252(1), 66, 2005 |