검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
Gallium nitride nanoparticle synthesis using nonthermal plasma with gallium vapor You KH, Kim JH, You SJ, Lee HC, Ruh H, Seong DJ Current Applied Physics, 18(12), 1553, 2018 |
| 2 |
Measurements of electron energy probability functions in helicon discharge by laser Thomson scattering Seo BH, You SJ, Kim JH, Seong DJ, Shin YH, Chang HY Thin Solid Films, 547, 52, 2013 |
| 3 |
A cutoff probe for the measurement of high density plasma You KH, You SJ, Kim DW, Na BK, Seo BH, Kim JH, Shin YH, Seong DJ, Chang HY Thin Solid Films, 547, 250, 2013 |
| 4 |
Atmospheric pressure microplasma source based on parallel stripline resonator Tran TH, You SJ, Park M, Kim JH, Seong DJ, Shin YH, Jeong JR Current Applied Physics, 11(5), S126, 2011 |
| 5 |
The effect of the magnetron sputtering gun size on the characteristics of the plasma and CNx film deposition Roh KM, You SJ, Kim DW, Han JH, Kim JH, Seong DJ Thin Solid Films, 519(20), 6649, 2011 |
| 6 |
Role of transverse magnetic field in the capacitive discharge You SJ, Hai TT, Park M, Kim DW, Kim JH, Seong DJ, Shin YH, Lee SH, Park GY, Lee JK, Chang HY Thin Solid Films, 519(20), 6981, 2011 |
| 7 |
Analysis of interface switching for Nb doped SrTiO3 single crystal device using complex impedance spectroscopy Lee J, Bourim E, Shin D, Lee JS, Seong DJ, Park J, Lee W, Chang M, Jung S, Shin J, Hwang H Current Applied Physics, 10(1), E68, 2010 |
| 8 |
On monitoring of gas leak in the plasma vacuum process with optical emission spectroscopy Pyun SC, Kwon JH, You SJ, Seong DJ, Kim JH, Shin YH, Shin JS Thin Solid Films, 518(22), 6658, 2010 |
| 9 |
A simple analysis on the abnormal behavior of the argon metastable density in an inductively coupled Ar plasma Park M, Chang HY, You SJ, Kim JH, Seong DJ, Shin YH Thin Solid Films, 518(22), 6694, 2010 |
| 10 |
Dependence of the Metal Electrode and Improved Pulse Switching Speed of La0.7Ca0.3MnO3 as a Resistance Change Memory Device Hasan M, Dong R, Choi H, Yoon J, Park JB, Seong DJ, Hwang H Journal of the Electrochemical Society, 156(4), H239, 2009 |