검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Genetic control of distal stem cell fate within root and embryonic meristems Crawford BCW, Sewell J, Golembeski G, Roshan C, Long JA, Yanofsky MF Science, 347(6222), 655, 2015 |
| 2 |
Annealing temperature stability of Ir and Ni-based Ohmic contacts on AlGaN/GaN high electron mobility transistors Kang BS, Kim S, La Roche JR, Ren F, Fitch RC, Gillespie JK, Moser N, Jenkins T, Sewell J, Via D, Crespo A, Dabiran AM, Chow PP, Osinsky A, Pearton SJ Journal of Vacuum Science & Technology B, 22(6), 2635, 2004 |
| 3 |
Small signal measurement of SC2O3AlGaN/GaN moshemts Luo B, Mehandru R, Kang BS, Kim J, Ren F, Gila BP, Onstine AH, Abernathy CR, Pearton SJ, Gotthold D, Birkhahn R, Peres B, Fitch R, Gillespie JK, Jenkins T, Sewell J, Via D, Crespo A Solid-State Electronics, 48(2), 355, 2004 |
| 4 |
Proton irradiation of MgO- or SC2O3 passivated AlGaN/GaN high electron mobility transistors Luo B, Ren F, Allums KK, Gila BP, Onstine AH, Abernathy CR, Pearton SJ, Dwivedi R, Fogarty TN, Wilkins R, Fitch RC, Gillespie JK, Jenkins TJ, Dettmer R, Sewell J, Via GD, Crespo A, Baca AG, Shul RJ Solid-State Electronics, 47(6), 1015, 2003 |
| 5 |
Uniformity of dc and rf performance of MBE-grown AlGaN/GaN HEMTS on HVPE-grown buffers Gillespie JK, Fitch RC, Moser N, Jenkins T, Sewell J, Via D, Crespo A, Dabiran AM, Chow PP, Osinsky A, Mastro MA, Tsvetkov D, Soukhoveev V, Usikov A, Dmitriev V, Luo B, Pearton SJ, Ren F Solid-State Electronics, 47(10), 1859, 2003 |
| 6 |
Comparison of surface passivation films for reduction of current collapse in AlGaN/GaN high electron mobility transistors Luo B, Mehandru R, Kim J, Ren F, Gila BP, Onstine AH, Abernathy CR, Pearton SJ, Fitch R, Gillespie J, Jenkins T, Sewell J, Via D, Crespo A, Irokawa Y Journal of the Electrochemical Society, 149(11), G613, 2002 |
| 7 |
The role of cleaning conditions and epitaxial layer structure on reliability of Sc2O3 and MgO passivation on AlGaN/GaN HEMTS Luo B, Mehandru RM, Kim J, Ren F, Gila BP, Onstine AH, Abernathy CR, Pearton SJ, Fitch RC, Gillespie J, Dellmer R, Jenkins T, Sewell J, Via D, Crespo A Solid-State Electronics, 46(12), 2185, 2002 |
| 8 |
"Safe" solvent resist process for sub-quarter micron T-gates Via D, Bozada C, Cerny C, DeSalvo G, Dettmer R, Ebel J, Gillespie J, Jenkins T, Nakano K, Pettiford C, Quach T, Sewell J Journal of Vacuum Science & Technology B, 15(6), 2916, 1997 |