| 1 |
Effects of ion irradiation damage on the initial interactions of oxygen with polycrystalline gadolinium
Abramovich A, Barzilai S, Cohen S, Shamir N, Eisen Y, Mintz MH, Zalkind S
Solid State Ionics, 309, 130, 2017 |
| 2 |
Amorphous carbon enhancement of hydrogen penetration into UO2
Zalkind S, Shamir N, Gouder T, Akhvlediani R, Hoffman A
Applied Surface Science, 305, 539, 2014 |
| 3 |
Water chemisorption on a sputter deposited uranium dioxide film - Effect of defects
Cohen S, Mintz MH, Zalkind S, Seibert A, Gouder T, Shamir N
Solid State Ionics, 263, 39, 2014 |
| 4 |
Sixth International Symposium - Effects of surface heterogeneity in adsorption and catalysis on solids - ISSHAC VI, Zakopane, Poland, 28th August 2nd September 2006
Do D, Nicholson PD, Ustinov EA, Murzin DY, Monson PA, Zhou L, Guil JM, Olivier J, Villieras F, Zgrablich G, Shamir N, Jagiello J, Thommes M, Rudzinski W, Witko M
Applied Surface Science, 253(13), 5565, 2007 |
| 5 |
Catalysis, by amorphous carbon, of H-2 attack on oxidized U-0.1 wt% Cr surfaces
Shamir N
Applied Surface Science, 253(14), 5957, 2007 |
| 6 |
The use of direct recoil spectrometry (DRS) for the study of water vapor interactions on polycrystalline metallic surfaces-the H2O/U and H2O/Ti systems
Mintz MH, Shamir N
Applied Surface Science, 252(3), 633, 2005 |
| 7 |
Reducing the current crowding effect in bipolar transistors by tunnel diode emitter design
Shamir N, Ritter D
Solid-State Electronics, 47(1), 127, 2003 |
| 8 |
Tunnel diode collector contact in InP based PNP heterojunction bipolar transistors
Shamir N, Ritter D, Cytermann C
Solid-State Electronics, 46(6), 785, 2002 |
| 9 |
Comparison of titanium and platinum Schottky barrier heights to Ga0.47In0.53As obtained from Franz Keldysh oscillations and Schottky diode characteristics
Shamir N, Sheinman B, Ritter D, Gershoni D
Solid-State Electronics, 45(3), 475, 2001 |
| 10 |
Transient Charging and Slow Trapping in Ultrathin SiO2-Films on Si During Electron-Bombardment
Shamir N, Mihaychuk JG, Vandriel HM
Journal of Vacuum Science & Technology A, 15(4), 2081, 1997 |
