검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Electric Field Accelerating Interface Diffusion in Cu/Ru/TaN/Si Stacks during Annealing Wang L, Cao ZH, Syed JA, Hu K, She QW, Meng XK Electrochemical and Solid State Letters, 15(6), H188, 2012 |
| 2 |
Improved diffusion barrier performance of Ru/TaN bilayer by N effusion in TaN underlayer Wang L, Cao ZH, Hu K, She QW, Meng XK Materials Chemistry and Physics, 135(2-3), 806, 2012 |
| 3 |
Effects of electric field annealing on the interface diffusion of Cu/Ta/Si stacks Wang L, Cao ZH, Hu K, She QW, Meng XK Applied Surface Science, 257(24), 10845, 2011 |