검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Negative capacitance phenomena depending on the wake-up effect in the ferroelectric Si:HfO2 film Park S, Chun MC, Park S, Park GY, Jung M, Noh Y, Ahn SE, Kang BS Current Applied Physics, 19(3), 347, 2019 |
| No. | Article |
|---|---|
| 1 |
Negative capacitance phenomena depending on the wake-up effect in the ferroelectric Si:HfO2 film Park S, Chun MC, Park S, Park GY, Jung M, Noh Y, Ahn SE, Kang BS Current Applied Physics, 19(3), 347, 2019 |