검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Free-charge carrier profile of iso- and aniso-type Si homojunctions determined by terahertz and mid-infrared ellipsometry Boosalis A, Hofmann T, Sik J, Schubert M Thin Solid Films, 519(9), 2604, 2011 |
| 2 |
OISF pattern and grown-in precipitates in heavily boron doped silicon Valek L, Lysacek D, Sik J Journal of the Electrochemical Society, 154(10), H904, 2007 |
| 3 |
Electrical properties of MOS structures on nitrogen-doped Czochralski-grown silicon: A positron annihilation study Slugen V, Harmatha L, Tapaina M, Ballo P, Pisecny P, Sik J, Kogel G, Krsjak V Applied Surface Science, 252(9), 3201, 2006 |