1 |
Stability and aging studies of lead sulfide quantum dot films: Photoabsorption, morphology, and chemical state characteristics Wang JS, Smith HE, Brown GJ Materials Chemistry and Physics, 154, 44, 2015 |
2 |
Epitaxial Graphene Growth by Carbon Molecular Beam Epitaxy (CMBE) Park J, Mitchel WC, Grazulis L, Smith HE, Eyink KG, Boeckl JJ, Tomich DH, Pacley SD, Hoelscher JE Advanced Materials, 22(37), 4140, 2010 |
3 |
Study of the effect of changing the microstructure of titania layers on composite solar cell performance Xie Z, Henry BM, Kirov KR, Smith HE, Barkhouse A, Grovenor CRM, Assender HE, Briggs GAD, Webster GR, Burn PL, Kano M, Tsukahara Y Thin Solid Films, 511, 523, 2006 |
4 |
Chiroptical properties of the benzene chromophore. A method for the determination of the absolute configurations of benzene compounds by application of the benzene sector and benzene chirality rules Smith HE Chemical Reviews, 98(4), 1709, 1998 |
5 |
Scanning capacitance microscopy measurement of two-dimensional dopant profiles across junctions Kopanski JJ, Marchiando JF, Berning DW, Alvis R, Smith HE Journal of Vacuum Science & Technology B, 16(1), 339, 1998 |
6 |
Auger voltage contrast imaging for the delineation of two-dimensional junctions in cross-sectioned metal-oxide-semiconductor devices Werner WSM, Lakatha H, Smith HE, LeTarte L, Ambrose V, Baker J Journal of Vacuum Science & Technology B, 16(1), 420, 1998 |
7 |
Optically-Active Amines .41. Application of the Benzene Chirality Rule to Chiral Ring-Substituted Benzylcarbinamines and Benzylcarbinamine Salts Smith HE, Neergaard JR Journal of the American Chemical Society, 119(1), 116, 1997 |
8 |
Optically-Active Amines .40. Application of the Benzene Sector Rule to the Circular-Dichroism of Chiral Benzylcarbinamines and Benzylcarbinols Smith HE, Neergaard JR Journal of the American Chemical Society, 118(33), 7694, 1996 |
9 |
Sputter Depth Profiling of Surface-Potentials in Silicon Semiconductors Smith HE, Harris WC Journal of Vacuum Science & Technology B, 14(1), 305, 1996 |
10 |
Influence of the Substrate Doping Level on Spreading Resistance Profiling Vandervorst W, Clarysse T, Smith HE Journal of Vacuum Science & Technology B, 14(1), 404, 1996 |