화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 Stability and aging studies of lead sulfide quantum dot films: Photoabsorption, morphology, and chemical state characteristics
Wang JS, Smith HE, Brown GJ
Materials Chemistry and Physics, 154, 44, 2015
2 Epitaxial Graphene Growth by Carbon Molecular Beam Epitaxy (CMBE)
Park J, Mitchel WC, Grazulis L, Smith HE, Eyink KG, Boeckl JJ, Tomich DH, Pacley SD, Hoelscher JE
Advanced Materials, 22(37), 4140, 2010
3 Study of the effect of changing the microstructure of titania layers on composite solar cell performance
Xie Z, Henry BM, Kirov KR, Smith HE, Barkhouse A, Grovenor CRM, Assender HE, Briggs GAD, Webster GR, Burn PL, Kano M, Tsukahara Y
Thin Solid Films, 511, 523, 2006
4 Chiroptical properties of the benzene chromophore. A method for the determination of the absolute configurations of benzene compounds by application of the benzene sector and benzene chirality rules
Smith HE
Chemical Reviews, 98(4), 1709, 1998
5 Scanning capacitance microscopy measurement of two-dimensional dopant profiles across junctions
Kopanski JJ, Marchiando JF, Berning DW, Alvis R, Smith HE
Journal of Vacuum Science & Technology B, 16(1), 339, 1998
6 Auger voltage contrast imaging for the delineation of two-dimensional junctions in cross-sectioned metal-oxide-semiconductor devices
Werner WSM, Lakatha H, Smith HE, LeTarte L, Ambrose V, Baker J
Journal of Vacuum Science & Technology B, 16(1), 420, 1998
7 Optically-Active Amines .41. Application of the Benzene Chirality Rule to Chiral Ring-Substituted Benzylcarbinamines and Benzylcarbinamine Salts
Smith HE, Neergaard JR
Journal of the American Chemical Society, 119(1), 116, 1997
8 Optically-Active Amines .40. Application of the Benzene Sector Rule to the Circular-Dichroism of Chiral Benzylcarbinamines and Benzylcarbinols
Smith HE, Neergaard JR
Journal of the American Chemical Society, 118(33), 7694, 1996
9 Sputter Depth Profiling of Surface-Potentials in Silicon Semiconductors
Smith HE, Harris WC
Journal of Vacuum Science & Technology B, 14(1), 305, 1996
10 Influence of the Substrate Doping Level on Spreading Resistance Profiling
Vandervorst W, Clarysse T, Smith HE
Journal of Vacuum Science & Technology B, 14(1), 404, 1996