화학공학소재연구정보센터
검색결과 : 16건
No. Article
1 Effect on Al:MO2/In0.53Ga0.47As interface (M = Hf, Zr) of trimethyl-aluminum pre-treatment during atomic layer deposition
Lamperti A, Molle A, Cianci E, Wiemer C, Spiga S, Fanciulli M
Thin Solid Films, 563, 44, 2014
2 Preface to E-MRS 2012 Symposium L: Novel Functional Materials and Nanostructures for innovative non-volatile memory devices
Spiga S, Muller C, Cowburn R, Riel H, Siegel J
Thin Solid Films, 533, V, 2013
3 Atomic layer-deposited Al-HfO2/SiO2 bi-layers towards 3D charge trapping non-volatile memory
Congedo G, Wiemer C, Lamperti A, Cianci E, Molle A, Volpe FG, Spiga S
Thin Solid Films, 533, 9, 2013
4 Atomic Layer Deposition of Al-Doped ZrO2 Thin Films as Gate Dielectric for In0.53Ga0.47As
Lamagna L, Molle A, Wiemer C, Spiga S, Grazianetti C, Congedo G, Fanciulli M
Journal of the Electrochemical Society, 159(3), H220, 2012
5 Cubic/Tetragonal Phase Stabilization in High-kappa ZrO2 Thin Films Grown Using O-3-Based Atomic Layer Deposition
Lamperti A, Lamagna L, Congedo G, Spiga S
Journal of the Electrochemical Society, 158(10), G221, 2011
6 Resistance change in memory structures integrating CuTCNQ nanowires grown on dedicated HfO2 switching layer
Muller C, Deleruyelle D, Muller R, Thomas M, Demolliens A, Turquat C, Spiga S
Solid-State Electronics, 56(1), 168, 2011
7 Control of filament size and reduction of reset current below 10 mu A in NiO resistance switching memories
Nardi F, Ielmini D, Cagli C, Spiga S, Fanciulli M, Goux L, Wouters DJ
Solid-State Electronics, 58(1), 42, 2011
8 Resistive switching characteristics of NiO films deposited on top of W or Cu pillar bottom electrodes
Dumas C, Deleruyelle D, Demolliens A, Muller C, Spiga S, Cianci E, Fanciulli M, Tortorelli I, Bez R
Thin Solid Films, 519(11), 3798, 2011
9 High permittivity materials for oxide gate stack in Ge-based metal oxide semiconductor capacitors
Molle A, Baldovino S, Spiga S, Fanciulli M
Thin Solid Films, 518, S96, 2010
10 Interface analysis of Ge ultra thin layers intercalated between GaAs substrates and oxide stacks
Molle A, Lamagna L, Spiga S, Fanciulli M, Brammertz G, Meuris M
Thin Solid Films, 518, S123, 2010