검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Electromigration Drift Velocity in Al-Alloy and Cu-Alloy Lines Hu CK, Lee KY, Lee KL, Cabral C, Colgan EG, Stanis C Journal of the Electrochemical Society, 143(3), 1001, 1996 |
| 2 |
Roughness Analysis of Si/SiGe Heterostructures Feenstra RM, Lutz MA, Stern F, Ismail K, Mooney PM, Legoues FK, Stanis C, Chu JO, Meyerson BS Journal of Vacuum Science & Technology B, 13(4), 1608, 1995 |