검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Vibrational Relaxation Dynamics of an Azido-Cobalt(II) Complex from Femtosecond UV-Pump/MIR-Probe Spectroscopy and Model Simulations with Ab Initio Anharmonic Couplings Straub S, Stubbe J, Lindner J, Sarkar B, Vohringer P Inorganic Chemistry, 59(20), 14629, 2020 |
| 2 |
Photoinduced Dynamics of a Diazidocobalt(III) Complex Studied by Femtosecond UV-Pump/IR-to-Vis-Probe Spectroscopy Straub S, Domenianni LI, Lindner J, Vohringer P Journal of Physical Chemistry B, 123(37), 7893, 2019 |
| 3 |
Photochemical Kinetics of a Phosphine Oxide Free Radical Initiator from Femtosecond UV-Pump/Mid-IR-Probe Spectroscopy Straub S, Lindner J, Vohringer P Journal of Physical Chemistry A, 121(26), 4914, 2017 |
| 4 |
Particle filter for state of charge and state of health estimation for lithium-iron phosphate batteries Schwunk S, Armbruster N, Straub S, Kehl J, Vetter M Journal of Power Sources, 239, 705, 2013 |
| 5 |
Online Parameterization of a Function Describing the Open-Circuit Voltage by a Least Square Method with Adaptive Forgetting Factor Schwunk S, Straub S, Jung M Journal of the Electrochemical Society, 160(11), A2155, 2013 |
| 6 |
Influence of silicon nanocrystal size and density on the performance of non-volatile memory arrays Rao RA, Gasquet HP, Steimle RF, Rinkenberger G, Straub S, Muralidhar R, Anderson SGH, Yater JA, Ledezma JC, Hamilton J, Acred B, Swift CT, Hradsky B, Peschke J, Sadd M, Prinz EJ, Chang KM, White BE Solid-State Electronics, 49(11), 1722, 2005 |
| 7 |
A model for the channel potential of charge-trapping memories and its implications for device scaling Sadd M, Anderson SGH, Hradsky B, Muralidhar R, Prinz EJ, Rao R, Straub S, Steimle RF, Swift CT, White BE, Yater JA Solid-State Electronics, 49(11), 1754, 2005 |
| 8 |
Silicon nanocrystal based memory devices for NVM and DRAM applications Rao RA, Steimle RF, Sadd M, Swift CT, Hradsky B, Straub S, Merchant T, Stoker M, Anderson SGH, Rossow M, Yater J, Acred B, Harber K, Prinz EJ, White BE, Muralidhar R Solid-State Electronics, 48(9), 1463, 2004 |