화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Scanning spreading resistance microscopy current transport studies on doped III-V semiconductors
Lu RP, Kavanagh KL, Dixon-Warren SJ, SpringThorpe AJ, Streater R, Calder I
Journal of Vacuum Science & Technology B, 20(4), 1682, 2002
2 Two-dimensional profiling of carriers in a buried heterostructure multi-quantum-well laser: Calibrated scanning spreading resistance microscopy and scanning capacitance microscopy
Ban D, Sargent EH, Dixon-Warren SJ, Grevatt T, Knight G, Pakulski G, SpringThorpe AJ, Streater R, White JK
Journal of Vacuum Science & Technology B, 20(5), 2126, 2002
3 Calibrated scanning spreading resistance microscopy profiling of carriers in III-V structures
Lu RP, Kavanagh KL, Dixon-Warren SJ, Kuhl A, Thorpe AJS, Griswold E, Hillier G, Calder I, Ares R, Streater R
Journal of Vacuum Science & Technology B, 19(4), 1662, 2001