화학공학소재연구정보센터
검색결과 : 4건
No. Article
1 Ultimate nanopatterning of Si substrate using filtered liquid metal alloy ion source-focused ion beam
Benkouider A, Berbezier I, Ronda A, Favre L, Gomes ER, Marcus IC, Alonso I, Delobbe A, Sudraud P
Thin Solid Films, 543, 69, 2013
2 Electric field induced motion of metallic droplets: Application to submicron contactor
Dallaporta H, Prestigiacomo M, Bedu F, Tonneau D, Chatain D, Sudraud P
Journal of Vacuum Science & Technology B, 28(4), L35, 2010
3 Structural and electrical studies of conductive nanowires prepared by focused ion beam induced deposition
Reguer A, Bedu F, Tonneau D, Dallaporta H, Prestigiacomo M, Houel A, Sudraud P
Journal of Vacuum Science & Technology B, 26(1), 175, 2008
4 New Characterization Method of Ion Current-Density Profile Based on Damage Distribution of Ga+ Focused-Ion Beam Implantation in GaAs
Benassayag G, Vieu C, Gierak J, Sudraud P, Corbin A
Journal of Vacuum Science & Technology B, 11(6), 2420, 1993