검색결과 : 6건
No. | Article |
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1 |
Band alignment of metal-oxide-semiconductor structure by internal photoemission spectroscopy and spectroscopic ellipsometry Nguyen NV, Kirillov OA, Suehle JS Thin Solid Films, 519(9), 2811, 2011 |
2 |
Comparison of scanning capacitance microscopy and scanning Kelvin probe microscopy in determining two-dimensional doping profiles of Si homostructures Park SE, Nguyen NV, Kopanski JJ, Suehle JS, Vogel EM Journal of Vacuum Science & Technology B, 24(1), 404, 2006 |
3 |
Interface characterization of molecular-monolayer/SiO2 based molecular junctions Richter CA, Hacker CA, Richter LJ, Kirillov OA, Suehle JS, Vogel EM Solid-State Electronics, 50(6), 1088, 2006 |
4 |
In situ conductivity characterization of oxide thin film growth phenomena on microhotplates DiMeo F, Cavicchi RE, Semancik S, Suehle JS, Tea NH, Small J, Armstrong JT, Kelliher JT Journal of Vacuum Science & Technology A, 16(1), 131, 1998 |
5 |
The Use of a Double Mask System to Prevent Ti Diffusion from a Ti/Pt/Au Ohmic Contact on Diamond Waytena GL, Hoff HA, Ma DI, Isaacson IP, Rebbert ML, Marrian C, Suehle JS Journal of the Electrochemical Society, 143(7), 2392, 1996 |
6 |
Pulsed Desorption-Kinetics Using Micromachined Microhotplate Arrays Cavicchi RE, Poirier GE, Suehle JS, Gaitan M, Semancik S, Burgess DR Journal of Vacuum Science & Technology A, 12(4), 2549, 1994 |