| 1 |
Influence of annealing on the optical properties of reactively sputtered BCN thin films
Todi VO, Shantheyanda BP, Sundaram KB
Materials Chemistry and Physics, 141(2-3), 596, 2013 |
| 2 |
Mathematical characterization of oxidized crystalline silicon nanowires grown by electroless process
Mertens RG, Sundaram KB
Applied Surface Science, 258(10), 4607, 2012 |
| 3 |
Effect of Substrate Temperature on Optical Properties of BCN Thin Films
Todi VO, Sundaram KB
Electrochemical and Solid State Letters, 14(10), G49, 2011 |
| 4 |
On the phase identification of dc magnetron sputtered Pt-Ru alloy thin films
Warren AP, Todi RM, Yao B, Barmak K, Sundaram KB, Coffey KR
Journal of Vacuum Science & Technology A, 26(5), 1208, 2008 |
| 5 |
Effect of N-2/Ar gas mixture composition on the chemistry of SiCBN thin films prepared by RF reactive sputtering
Vijayakumar A, Todi RM, Sundaram KB
Journal of the Electrochemical Society, 154(4), H271, 2007 |
| 6 |
Oxygen annealing characterization of reactively sputtered SiCBN thin films by x-ray photoelectron spectroscopy
Vijayakumar A, Todi RM, Sundaram KB
Journal of the Electrochemical Society, 154(7), H547, 2007 |
| 7 |
In situ high temperature electrical characterization of RF sputtered SiCBN thin films
Vijayakumar A, Todi RM, Todi VO, Sundaram KB
Journal of the Electrochemical Society, 154(10), H875, 2007 |
| 8 |
X-ray photoelectron spectroscopy analysis of oxygen annealed radio frequency sputter deposited SiCN thin films
Todi RM, Warren AP, Sundaram KB, Coffey KR
Journal of the Electrochemical Society, 153(7), G640, 2006 |
| 9 |
Investigation of oxygen annealing effects on RF sputter deposited SiC thin films
Todi RM, Sundaram KB, Warren AP, Scammon K
Solid-State Electronics, 50(7-8), 1189, 2006 |
| 10 |
Characterization of copper indium ditelluride/electrolyte interface utilizing electrochemical impedance spectroscopy
Vijayakumar A, Du TB, Sundaram KB
Applied Surface Science, 242(1-2), 168, 2005 |
