검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Random phase mask as a model of rough surface. Part I. Theory Svitasheva SN Thin Solid Films, 519(9), 2718, 2011 |
| 2 |
Random phase mask as a model of a rough surface Part II. Experiment Svitasheva SN Thin Solid Films, 519(9), 2722, 2011 |
| 3 |
Ellipsometric investigation of the mechanism of the formation of titanium oxynitride nanolayers Dultsev FN, Svitasheva SN, Nastaushev YV, Aseev AL Thin Solid Films, 519(19), 6344, 2011 |
| 4 |
Study of excess silicon at Si3N4 thermal SiO2 interface using ellipsometric measurements Gritsenko VA, Svitasheva SN, Petrenko IP, Wong H, Xu JB, Wilson IH Journal of the Electrochemical Society, 146(2), 780, 1999 |
| 5 |
Analysis of general ambiguity of inverse ellipsometric problem Polovinkin VG, Svitasheva SN Thin Solid Films, 313-314, 128, 1998 |
| 6 |
Spectral dependence of the complex refractive index shift across the semiconductor-metal transition in thermally-oxidized vanadium Svitasheva SN, Kruchinin VN Thin Solid Films, 313-314, 319, 1998 |