화학공학소재연구정보센터
검색결과 : 47건
No. Article
1 Titanium nitride films for micro-supercapacitors: Effect of surface chemistry and film morphology on the capacitance
Achour A, Porto RL, Soussou MA, Islam M, Boujtita M, Aissa KA, Le Brizoual L, Djouadi A, Brousse T
Journal of Power Sources, 300, 525, 2015
2 Influence of Sr+2 concentrations on growth of SrTiO3 thin films synthesized by hydrothermal-galvanic couple method
Tsai YH, Chieh YC, Lu FH
Thin Solid Films, 570, 479, 2014
3 The effect of electrochemical lithiation on physicochemical properties of RF-sputtered Sn thin films
Nimisha CS, Venkatesh G, Munichandraiah N, Rao GM
Journal of Applied Electrochemistry, 41(11), 1287, 2011
4 Development of texture in TiN films deposited by filtered cathodic vacuum arc
Cheng YH, Tay BK
Journal of Crystal Growth, 252(1-3), 257, 2003
5 The amorphous range in sputtered Si-Al-Sn films
Hatchard TD, Dahn JR, Trussler S, Fleischauer M, Bonakdarpour A, Mueller-Neuhaus JR, Hewitt KC
Thin Solid Films, 443(1-2), 144, 2003
6 Physical and morphological characterization of reactively magnetron sputtered TiN films
Vaz F, Machado P, Rebouta L, Mendes JA, Lanceros-Mendez S, Cunha L, Nascimento SMC, Goudeau P, Riviere JP, Alves E, Sidor A
Thin Solid Films, 420-421, 421, 2002
7 Microstructural evolution during tempering of arc-evaporated Cr-N coatings
Almer J, Oden M, Hultman L, Hakansson G
Journal of Vacuum Science & Technology A, 18(1), 121, 2000
8 Mechanical properties of titanium nitride coatings deposited by inductively coupled plasma assisted direct current magnetron sputtering
Lim JW, Park HS, Park TH, Lee JJ, Joo J
Journal of Vacuum Science & Technology A, 18(2), 524, 2000
9 Crystalline structure of very hard tungsten carbide thin films obtained by reactive pulsed laser deposition
Mihailescu IN, Gyorgy E, Marin G, Popescu M, Teodorescu VS, Van Landuyt J, Grivas C, Hatziapostolou A
Journal of Vacuum Science & Technology A, 17(1), 249, 1999
10 Graded TiAlN layers deposited by electron cyclotron resonance-assisted reactive sputtering
Raveh A, Rosen DZ, Shneck R, Weiss M
Journal of Vacuum Science & Technology A, 17(4), 2001, 1999