검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Structural Characterization of Plasma-Doped Silicon by High-Resolution X-Ray-Diffraction Chapek DL, Conrad JR, Matyi RJ, Felch SB Journal of Vacuum Science & Technology B, 12(2), 951, 1994 |
| No. | Article |
|---|---|
| 1 |
Structural Characterization of Plasma-Doped Silicon by High-Resolution X-Ray-Diffraction Chapek DL, Conrad JR, Matyi RJ, Felch SB Journal of Vacuum Science & Technology B, 12(2), 951, 1994 |