검색결과 : 1건
No. | Article |
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1 |
Characterization of ultrashallow dopant profiles using spreading resistance profiling Tan LS, Tan LCP, Leong MS, Mazur RG, Ye CW Journal of Vacuum Science & Technology B, 20(1), 483, 2002 |
No. | Article |
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1 |
Characterization of ultrashallow dopant profiles using spreading resistance profiling Tan LS, Tan LCP, Leong MS, Mazur RG, Ye CW Journal of Vacuum Science & Technology B, 20(1), 483, 2002 |