검색결과 : 35건
| No. | Article |
|---|---|
| 1 |
Effect of hygral swelling and shrinkage on mechanical durability of fuel cell membranes Alavijeh AS, Bhattacharya S, Thomas O, Chuy C, Yang YS, Zhang HX, Kjeang E Journal of Power Sources, 427, 207, 2019 |
| 2 |
Progress of in situ synchrotron X-ray diffraction studies on the mechanical behavior of materials at small scales Cornelius TW, Thomas O PROGRESS IN MATERIALS SCIENCE, 94, 384, 2018 |
| 3 |
In situ X-ray diffraction studies on the piezoelectric response of PZT thin films Davydok A, Cornelius TW, Mocuta C, Lima EC, Araujo EB, Thomas O Thin Solid Films, 603, 29, 2016 |
| 4 |
X-ray nanodiffraction in forward scattering and Bragg geometry of a single isolated Ag-Au nanowire Fernandez S, Richard MI, Floettoto D, Richter G, Mandula O, Aizarna ME, Favre-Nicolin V, Burghammer M, Schtilli T, Thomas O Thin Solid Films, 617, 9, 2016 |
| 5 |
Stress buildup during crystallization of thin chalcogenide films for memory applications: In situ combination of synchrotron X-Ray diffraction and wafer curvature measurements Ouled-Khachroum T, Richard MI, Noe P, Guichet C, Mocuta C, Sabbione C, Hippert F, Thomas O Thin Solid Films, 617, 44, 2016 |
| 6 |
Designing digital circuits with nano-scale devices: Challenges and opportunities Belleville M, Thomas O, Valentian A, Clermidy F Solid-State Electronics, 84, 38, 2013 |
| 7 |
Operation and stability analysis of bipolar OxRRAM-based Non-Volatile 8T2R SRAM as solution for information back-up Hraziia, Makosiej A, Palma G, Portal JM, Bocquet M, Thomas O, Clermidy F, Reyboz M, Onkaraiah S, Muller C, Deleruyelle D, Vladimirescu A, Amara A, Anghel C Solid-State Electronics, 90, 99, 2013 |
| 8 |
Size&Strain VI Preface Thomas O, Guinebretiere R Thin Solid Films, 530, 1, 2013 |
| 9 |
Stress measurements in tungsten coated through silicon vias for 3D integration Krauss C, Labat S, Escoubas S, Thomas O, Carniello S, Teva J, Schrank F Thin Solid Films, 530, 91, 2013 |
| 10 |
Exploring Pd-Si(001) and Pd-Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements Richard MI, Fouet J, Guichet C, Mocuta C, Thomas O Thin Solid Films, 530, 100, 2013 |