검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Investigation of the surface micro-roughness of fluoride films by spectroscopic ellipsometry Tikhonravov AV, Trubetskov MK, Krasilnikova AV, Masetti E, Duparre A, Quesnel E, Ristau D Thin Solid Films, 397(1-2), 229, 2001 |
| 2 |
Spectroscopic ellipsometric characterization of transparent thin film amorphous electronic materials : integrated analysis Popov KV, Tikhonravov AV, Campmany J, Bertran E, Bosch S, Canillas A Thin Solid Films, 313-314, 379, 1998 |
| 3 |
Characterization of Quasi-Rugate Filters Using Ellipsometric Measurements Tikhonravov AV, Trubetskov MK, Hrdina J, Sobota J Thin Solid Films, 277(1-2), 83, 1996 |