검색결과 : 11건
| No. | Article |
|---|---|
| 1 |
Estimating depolarization with the Jones matrix quality factor Hilfiker JN, Hale JS, Herzinger CM, Tiwald T, Hong N, Schoche S, Arwin H Applied Surface Science, 421, 494, 2017 |
| 2 |
Determining thickness and refractive index from free-standing ultrathin polymer films with spectroscopic ellipsometry Hilfiker JN, Stadermann M, Sun JN, Tiwald T, Hale JS, Miller PE, Aracne-Ruddle C Applied Surface Science, 421, 508, 2017 |
| 3 |
Dielectric function of zinc oxide thin films in a broad spectral range Mammadov E, Naghavi N, Jehl Z, Renou G, Tiwald T, Mamedov N, Lincot D, Guillemoles JF Thin Solid Films, 571, 593, 2014 |
| 4 |
Numerical ellipsometry: Analysis of thin metal layers using n-k-d twisted curve methods with multiple incidence angles Urban FK, Barton D, Tiwald T Journal of Vacuum Science & Technology A, 28(4), 947, 2010 |
| 5 |
Numerical ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence angles Urban FK, Barton D, Tiwald T Thin Solid Films, 518(5), 1411, 2009 |
| 6 |
Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry Hilfiker JN, Singh N, Tiwald T, Convey D, Smith SM, Baker JH, Tompkins HG Thin Solid Films, 516(22), 7979, 2008 |
| 7 |
Measuring the thickness of organic/polymer/biological films on glass substrates using spectroscopic ellipsometry Tompkins HG, Tiwald T, Bungay C, Hooper AE Journal of Vacuum Science & Technology A, 24(4), 1605, 2006 |
| 8 |
Use of molecular vibrations to analyze very thin films with infrared ellipsometry Tompkins HG, Tiwald T, Bungay C, Hooper AE Journal of Physical Chemistry B, 108(12), 3777, 2004 |
| 9 |
Fundamental studies on large area Cu(In,Ga)Se-2 films for high efficiency solar cells Hermann AM, Gonzalez C, Ramakrishnan PA, Balzar D, Popa N, Rice P, Marshall CH, Hilfiker JN, Tiwald T, Sebastian PJ, Calixto ME, Bhattacharya RN Solar Energy Materials and Solar Cells, 70(3), 345, 2001 |
| 10 |
Growth and characterization of large area Cu(In,Ga)Se-2 films Hermann AM, Gonzalez C, Ramakrishnan PA, Balzar D, Marshall CH, Hilfiker JN, Tiwald T Thin Solid Films, 387(1-2), 54, 2001 |