검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Comparative study of charge trapping in high-dose Si and Ge-implanted Al/SiO2/Si structures Nazarov A, Skorupa W, Osiyuk IN, Tjagulskii IP, Lysenko VS, Yankov RA, Gebel T Journal of the Electrochemical Society, 152(2), F20, 2005 |