| 1 |
Suppression of ion migration through cross-linked PDMS doping to enhance the operational stability of perovskite solar cells
Kang JC, Huang R, Guo SX, Han GH, Sun X, Ismail I, Ding CZ, Li FS, Luo Q, Li YJ, Ma CQ
Solar Energy, 217, 105, 2021 |
| 2 |
Using ToF-SIMS to study metal ions transfer between chalcopyrite and galena during grinding
Lai H, Liu QJ, Deng JS, Wen SM
Advanced Powder Technology, 31(7), 2650, 2020 |
| 3 |
Configurations of lead(II)-benzohydroxamic acid complexes in colloid and interface: A new perspective
Wei Z, Hu YH, Han HS, Sun W
Journal of Colloid and Interface Science, 562, 342, 2020 |
| 4 |
The effect of particle size, temperature and residence time on the yields and reactivity of olive stones from torrefaction
Trubetskaya A, Grams J, Leahy JJ, Johnson R, Gallagher P, Monaghan RFD, Kwapinska M
Renewable Energy, 160, 998, 2020 |
| 5 |
The influence of atomic layer deposition process temperature on ZnO thin film structure
Borylo P, Matus K, Lukaszkowicz K, Kubacki J, Balin K, Basiaga M, Szindler M, Mikula J
Applied Surface Science, 474, 177, 2019 |
| 6 |
TOF-SIMS study of morphology and chemical composition of wustite-based precursor and iron catalyst for ammonia synthesis
Rogowski J
Applied Surface Science, 469, 82, 2019 |
| 7 |
Molecular analysis of additives and impurities accumulated on copper electrodeposited layer by time-of-flight secondary ion mass spectrometry
Mroczka R, Lopucki R, Zukocinski G
Applied Surface Science, 463, 412, 2019 |
| 8 |
Effect of mass segment size on polymer ToF-SIMS multivariate analysis using a universal data matrix
Madiona RMT, Winkler DA, Muir BW, Pigram PJ
Applied Surface Science, 478, 465, 2019 |
| 9 |
Electrochemical, TOF-SIMS and XPS studies on the corrosion behavior of Q-phase in NaCl solutions as a function of pH
Ikeuba AI, Zhang B, Wang JQ, Han EH, Ke W
Applied Surface Science, 490, 535, 2019 |
| 10 |
Application of time-of-flight secondary ion mass spectrometry to the detection of surface intermediates during the first cycle of atomic layer deposition (ALD) of platinum on silica surfaces
Konh M, Lien C, Zaera F, Teplyakov AV
Applied Surface Science, 488, 468, 2019 |
