검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Time-of-flight secondary ion mass spectrometry study on Be/Al-based multilayer interferential structures Drozdov MN, Drozdov YN, Chkhalo NI, Polkovnikov VN, Yunin PA, Chirkin MV, Gololobov GP, Suvorov DV, Fu DJ, Pelenovich V, Tolstogouzov A Thin Solid Films, 661, 65, 2018 |
| 2 |
Surface composition of Cd1-xFe(Mn)(x)Te1-ySey systems exposed to air Bundaleski N, Radisavljevic I, Trigueiro J, Tolstogouzov A, Rakocevic Z, Medic M, Teodoro OMND, Romcevic N, Ivanovic N Materials Chemistry and Physics, 189, 35, 2017 |
| 3 |
Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry Drozdov MN, Drozdov YN, Csik A, Novikov AV, Vad K, Yunin PA, Yurasov DV, Belykh SF, Gololobov GP, Suvorov DV, Tolstogouzov A Thin Solid Films, 607, 25, 2016 |
| 4 |
TOF-SIMS study on surface modification of reed switch blades by pulsing nitrogen plasma Arushanov KA, Drozdov MN, Karabanov SM, Zeltser IA, Tolstogouzov A Applied Surface Science, 265, 642, 2013 |
| 5 |
Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques Ber B, Babor P, Brunkov PN, Chapon P, Drozdov MN, Duda R, Kazantsev D, Polkovnikov VN, Yunin P, Tolstogouzov A Thin Solid Films, 540, 96, 2013 |
| 6 |
An upgraded TOF-SIMS VG Ionex IX23LS: Study on the negative secondary ion emission of III-V compound semiconductors with prior neutral cesium deposition Ghumman CAA, Moutinho AMC, Santos A, Teodoro OMND, Tolstogouzov A Applied Surface Science, 258(7), 2490, 2012 |
| 7 |
Sputter depth profiling by secondary ion mass spectrometry coupled with sample current measurements Bardi U, Chenakin SP, Lavacchi A, Pagura C, Tolstogouzov A Applied Surface Science, 252(20), 7373, 2006 |
| 8 |
High-temperature oxidation of CrN/AlN multilayer coatings Bardi U, Chenakin SP, Ghezzi F, Giolli C, Goruppa A, Lavacchi A, Miorin E, Pagura C, Tolstogouzov A Applied Surface Science, 252(5), 1339, 2005 |
| 9 |
Mass-resolved ion scattering spectrometry for characterization of samples with historical value Daolio S, Pagura C, Tolstogouzov A Applied Surface Science, 222(1-4), 166, 2004 |