검색결과 : 1건
No. | Article |
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1 |
Experimental investigation of tunnel oxide thickness on charge transport through Si nanocrystal dot floating gate memories Punchaipetch P, Ichikawa K, Uraoka Y, Fuyuki T, Tomyo A, Takahashi E, Hayashi T Journal of Vacuum Science & Technology B, 24(3), 1271, 2006 |