검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Coherent and incoherent interference modelling and measurement of anisotropic multilayer stacks using conventional ellipsometry Touir H, Stchakovsky M, Ossikovski R, Warenghemb M Thin Solid Films, 455-56, 628, 2004 |
| No. | Article |
|---|---|
| 1 |
Coherent and incoherent interference modelling and measurement of anisotropic multilayer stacks using conventional ellipsometry Touir H, Stchakovsky M, Ossikovski R, Warenghemb M Thin Solid Films, 455-56, 628, 2004 |