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| No. | Article |
|---|---|
| 1 |
Electron-Energy-Loss Fine-Structure Measurements of Silicon-Nitride Films Tsukajima J, Arai K, Takatoh S, Enokijima T, Hayashi T, Yikegaki T, Kashiwagi A, Tokunaga K, Suzuki T, Fujikawa T, Usami S Thin Solid Films, 281-282, 318, 1996 |