검색결과 : 1건
No. | Article |
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1 |
SiO2/Si Interface Structures and Reliability Characteristics Hasegawa E, Ishitani A, Akimoto K, Tsukiji M, Ohta N Journal of the Electrochemical Society, 142(1), 273, 1995 |
No. | Article |
---|---|
1 |
SiO2/Si Interface Structures and Reliability Characteristics Hasegawa E, Ishitani A, Akimoto K, Tsukiji M, Ohta N Journal of the Electrochemical Society, 142(1), 273, 1995 |