| 1 |
Numerical ellipsometry: Use of parameter sensitivity to guide measurement selection for transparent anisotropic films
Urban FK, Barton D
Thin Solid Films, 663, 116, 2018 |
| 2 |
Reactive sputter deposition and annealing of nanometer scale NiO thin films for metal-insulator-metal tunnel junction diodes
Singh A, Bhansali S, Barton D, Urban FK
Thin Solid Films, 644, 23, 2017 |
| 3 |
Comparison of three methods for ellipsometry characterization of thin absorbing films
Barton D, Urban FK
Thin Solid Films, 644, 182, 2017 |
| 4 |
Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k plane
Urban FK, Barton D
Thin Solid Films, 562, 49, 2014 |
| 5 |
Numerical ellipsometry: Advanced analysis of thin absorbing films in the n-k plane
Urban FK, Barton D
Thin Solid Films, 519(19), 6284, 2011 |
| 6 |
Numerical ellipsometry: Analysis of thin metal layers using n-k-d twisted curve methods with multiple incidence angles
Urban FK, Barton D, Tiwald T
Journal of Vacuum Science & Technology A, 28(4), 947, 2010 |
| 7 |
Numerical ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence angles
Urban FK, Barton D, Tiwald T
Thin Solid Films, 518(5), 1411, 2009 |
| 8 |
Numerical ellipsometry: Ellipsometer analysis in the n-k plane for select combinations of metals, semiconductors, and insulators
Urban FK, Barton D
Thin Solid Films, 517(3), 1063, 2008 |
| 9 |
Numerical Ellipsometry: Ellipsometer analysis in the n-k plane for growing films on unknown homogeneous, isotropic substrates and unknown, layered substrates
Urban FK, Barton D
Thin Solid Films, 517(3), 1081, 2008 |
| 10 |
Ellipsometer analysis in the n-k plane
Barton D, Urban FK
Thin Solid Films, 516(2-4), 119, 2007 |
