검색결과 : 3건
No. | Article |
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1 |
Comparative-Study of the Interface Roughness of Ag/Au and Cu/Au Multilayers with Scanning-Tunneling-Microscopy and X-Ray-Diffraction Heyvaert I, Temst K, Vanhaesendonck C, Bruynseraede Y Journal of Vacuum Science & Technology B, 14(2), 1121, 1996 |
2 |
Nanolithographic Patterning of Au Films with a Scanning Tunneling Microscope Vanhaesendonck C, Stockman L, Neuttiens G, Strunk C, Bruynseraede Y Journal of Vacuum Science & Technology B, 13(3), 1290, 1995 |
3 |
Effect of Sample Topology on the Critical Fields of Mesoscopic Superconductors Moshchalkov VV, Gielen L, Strunk C, Jonckheere R, Qiu X, Vanhaesendonck C, Bruynseraede Y Nature, 373(6512), 319, 1995 |