검색결과 : 19건
| No. | Article |
|---|---|
| 1 |
Morphological and structural characterization of Sm-O-S compounds prepared by thermolysis of dithiocarbamate precursors Signore MA, Taurino A, Catalano M, Bellini E, Di Girolamo G, Laera AM, Quaranta F, Vasanelli L, Siciliano P Thin Solid Films, 556, 241, 2014 |
| 2 |
Monitoring the drying process of lasagna pasta through a novel sensing device-based method Sannino A, Capone S, Siciliano P, Ficarella A, Vasanelli L, Maffezzoli A Journal of Food Engineering, 69(1), 51, 2005 |
| 3 |
CdS nanocrystals from a quaternary water-in-oil microemulsion: Preparation and characterization of self-assembled layers Curri ML, Leo G, Alvisi M, Agostiano A, Della Monica M, Vasanelli L Journal of Colloid and Interface Science, 243(1), 165, 2001 |
| 4 |
Sol-gel processing and characterization of pure and metal-doped SnO2 thin films Epifani M, Alvisi M, Mirenghi L, Leo G, Siciliano P, Vasanelli L Journal of the American Ceramic Society, 84(1), 48, 2001 |
| 5 |
Application of a semiconductor sol-gel sensor array to the discrimination of pollutants in air Capone S, Epifani M, Quaranta F, Siciliano P, Vasanelli L Thin Solid Films, 391(2), 314, 2001 |
| 6 |
Structural and chemical investigation of surface and interface of multilayer optical coatings deposited by DIBS Alvisi M, Mirenghi L, Tapfer L, Rizzo A, Ferrara MC, Scaglione S, Vasanelli L Applied Surface Science, 157(1-2), 52, 2000 |
| 7 |
Sol-gel synthesis and characterization of Ag and Au nanoparticles in SiO2, TiO2, and ZrO2 thin films Epifani M, Giannini C, Tapfer L, Vasanelli L Journal of the American Ceramic Society, 83(10), 2385, 2000 |
| 8 |
HfO2 films with high laser damage threshold Alvisi M, Di Giulio M, Marrone SG, Perrone MR, Protopapa ML, Valentini A, Vasanelli L Thin Solid Films, 358(1-2), 250, 2000 |
| 9 |
Fine trimming of SmS film resistance by XeCl laser ablation Miodushevsky P, Protopapa ML, De Tomasi F, Perrone MR, Tundo S, Vasanelli L Thin Solid Films, 359(2), 251, 2000 |
| 10 |
Influence of the assisting-ion-beam parameters on the laser-damage threshold of SiO2 films Alvisi M, De Nunzio G, Perrone MR, Rizzo A, Scaglione S, Vasanelli L Thin Solid Films, 338(1-2), 269, 1999 |